M.Santo-Zarnik, M.Pavsek-Taskov, F.Novak, S.Macek.<br>
<a href="ftp://martin.ijs.muzej.si/pub/CSD/Reports/CSD-TR-95-8.ps.gz">
DFT of Pierce crystal oscillator - A case study.</a><br>
<i>Proc. Int'l Mixed Signal Testing Workshop</i>,
Grenoble, France, 1995, pp.118-123.<p>

Feasibility study of design-for-testability (DFT) of a voltage controlled
crystal oscillator with built-in MOS switches to increase its visibility
and controllability is presented. The aim was (first) to assess to what
extent the operation of the circuit is changed when switches are introduced,
and (second) to analyze the possibility of non-destructive localization
of faulty components in the provided test mode.
The work was performed in a development phase of a VCTCXO 16.348 MHz
for HIPOT HYBRID.