F.Novak, A.Biasizzo, M.Santo-Zarnik, I.Mozetic.<br>
On automatic fault isolation using DFT methodology for active analog filters.<br>
<i>Proc. 3rd European Test Conference 93</i>, pp.534-535, Rotterdam, 
The Netherland, 1993.<p>

DFT methodology for active analog filters based on analog scan 
structures has been proposed by Soma. We describe an extension of 
the methodology to automatic fault isolation by means of model-based 
diagnosis performed by the AI tool CLP(R). The implemented diagnostic 
algorithm uses results of measurements of magnitude and phase
characteristics for a given frequency in the normal mode and in the 
test modes. The diagnosis is performed incrementally, in each step 
reducing the set of potential candidates for the detected fault.
Presented case study illustrates the approach.